RFIC Complexity a Challenge for Academia and Industry

Piscataway, NJ / IEEE (2018) [Contribution to a book, Contribution to a conference proceedings]

[2018 IEEE International Conference on Integrated Circuits, Technologies and Applications, ICTA, 2018-11-21 - 2018-11-23, Beijing, Peoples R China]
Page(s): 1-6

Authors

Selected Authors

Heinen, Stefan
Henkel, Frank

Identifier